TY  - GEN
AU  - Stanczyk, Urszula
AU  - Jain, Lakhmi C.
TI  - Feature selection for data and pattern recognition
SN  - 9783662456194
PY  - 2015///
CY  - New York
PB  - Springer Heidelberg
KW  - PATTERN RECOGNITION SYSTEMS
KW  - COMPUTATIONAL INTELLIGENCE
KW  - Artificial intelligence
KW  - Rough sets
N1  - ISSN 1860 - 949X
ER  -