Hurst, Stanley L.
VLSI testing : digital and mixed analogue - London IEE 1998 - 532 p. - IEE circuits, Devices and systems series 9 .
0-85296-901-5
INTEGRATED CIRCUITS
621.3.049.771.14 / H8
VLSI testing : digital and mixed analogue - London IEE 1998 - 532 p. - IEE circuits, Devices and systems series 9 .
0-85296-901-5
INTEGRATED CIRCUITS
621.3.049.771.14 / H8