Library, University of Moratuwa, Sri Lanka catalog

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Chakradhar, Srimat T. Agrawal, Vishwani D. Bushnell, Michael L.

Neural models and algorithms for digital testing - Boston Kluwer Academic 1991 - xii, 184p. - The Kluwer international series in engineering and computer science .

ISBN: 0792391659

Subjects--Topical Terms:
LOGIC CIRCUITS-TESTING
NEURAL NETWORKS
COMPUTER SYSTEMS-DIGITAL

Universal Decimal Class. No.: 004.421:004.8 / C5

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